Used TEL / TOKYO ELECTRON Cellesta-I #293757173 for sale

TEL / TOKYO ELECTRON Cellesta-I is a semiconductor prober designed to perform wafer testing and analysis with high precision. The prober features a compact and lightweight design, making it ideal for installation and use in a variety of laboratory and manufacturing environments. TEL Cellesta-I has a wide choice of probing heads, allowing the user to select the most suitable heads based on their particular application's needs. It also offers a comprehensive suite of features specifically designed to provide the highest accuracy and fastest test times possible. The prober's revolutionary motorized x-y stage is capable of ultra-high resolution movements at up to 0.5 µm per step. This incredible accuracy allows for precise alignment between the probing head and the specimen's under-test area, further facilitating reliable results. TOKYO ELECTRON Cellesta-I also incorporates the latest sophisticated motion control system, allowing for precise automated operation during wafer testing. The advanced motion control system allows for double-sided wafers to be tested sequentially by "zipping" back and forth between test sites. This allows for substantially faster test times, improving overall throughput. The prober also features dual top-mounted pin cards for optimized testing efficiency and space reduction. Each pin card is capable of up to 512 pins, allowing for testing of a wide range of specimen sizes. Additionally, multiple pin cards can be installed and used simultaneously, further enhancing the testing throughput. In short, Cellesta-I is a highly capable and accurate prober, able to perform reliable wafer testing and analysis quickly and efficiently. Its advanced features and sophisticated motion control system help to ensure the highest levels of accuracy and throughput, making it the ideal choice for today's laboratory and manufacturing testing environments.