Used TEL / TOKYO ELECTRON Cellesta-I #9261580 for sale

TEL / TOKYO ELECTRON Cellesta-I is a prober, a type of machine used to test the performance of integrated circuits. It is built for speed and accuracy and can be used to test devices at various levels of complexity. The prober features a low-cost scanning EM probe for current measurements, as well as a high-accuracy 4-point probe capable of measuring small signals. The prober also features a high speed, high capacity electromechanical arm for low-contact resistance testing. TEL Cellesta-I is designed for high productivity and accurate testing capabilities of miniature integrated circuits (MICS) and IC assemblies. The prober can test a wide range of MICS including digital, analog, RF, optical and HVIC designs. The prober is used to run various tests including current measurements, pulse shaping, load/pull down tests, timing measurements and more. The prober has a high-speed, high-capacity drive system for fast inspection and accurate test parameters. It also has a special four-point probe that allows you to perform low-resistance measurements on a wide variety of contacts. The prober also has an advanced user interface, allowing for simple, intuitive operation of the prober. The prober can be set up and operated to quickly test and analyze results, allowing you to quickly troubleshoot any issues you may be having. The prober features advanced analysis capabilities with an integrated database to store all test results and allow for easy compilation and summarization of the data. The prober also has the ability to generate reports automatically, allowing for greater control of the testing process. It also utilizes software packages to customize and automate the testing process to hold up with customer requirements. The prober also has advanced failure analysis capabilities which generate more fine-grained information on failures such as false triggering of tests or open or short circuits. It provides real-time information on the performance of the targeted devices and how its contacts and functions are working. The failure analysis feature also allows for data collection during the device testing, allowing for a better understanding of the root cause of any failure. TOKYO ELECTRON Cellesta-I prober is an efficient and accurate testing tool that can quickly identify flaws and potential design problems in MICS and ICs of various complexity. With its advanced testing capabilities, it is the ideal test or burn-in station for any technology lab or assembly facility.