Used TEL / TOKYO ELECTRON Cellesta-I #9274382 for sale
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ID: 9274382
Wafer Size: 12"
Vintage: 2012
Prober, 12"
(12) Chambers
Process: CLN
(4) Loadports
Chemicals:
H202
NH4OH
IPA
HF
Extinguisher box
2012 vintage.
TEL / TOKYO ELECTRON Cellesta-I is a prober that is used for semiconductor testing. It is an advanced equipment designed to test a wide variety of semiconductor parameters. TEL Cellesta-I has a modular design and uses a modular machine interface to enable easy interchangeability of configurations. The system comprises two base units, which allow for a range of probe cards, measurement systems, and other components. It has an inbuilt high speed switch-mode and current sensing unit that can detect and analyze current levels and is able to monitor a wide range of voltage and current levels. TOKYO ELECTRON Cellesta-I has a full range of adapter and socket systems that enable testing of a variety of devices, from small-scale integrated circuits to large-scale integrated devices. It has an inbuilt high capacity data storage machine that allows for the storage of large amounts of test data. The tool is also designed to perform multiple tests on a single device and can accommodate up to sixteen independent probes. This asset enables parallel testing and high throughput performance. Cellesta-I also features some advanced monitoring features. It has an inbuilt monitoring model to check for power disturbances and equipment temperatures and voltage levels. The system is capable of detecting slowdowns and malfunction with a high degree of accuracy. The unit is also designed to be remotely controlled and can be operated from anywhere in the world. The machine is also highly accurate and reliable. It is equipped with advanced detection and filtering functions that are designed to minimize cross-talk and other interference from the environment. The tool also has calibration features that enable it to accurately measure voltages, currents, impedances and other parameters. TEL / TOKYO ELECTRON Cellesta-I is an advanced asset designed for efficient and accurate testing of semiconductor devices. It has a modular design that enables interchangeability of components and an inbuilt high speed switching and current sensing model. The equipment also has features that provide high accuracy, reliability and remote control capabilities. The system is capable of performing multiple tests and has an inbuilt data storage unit that stores large amounts of test data. This makes it an ideal tool for semiconductor testing.
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