Used TEL / TOKYO ELECTRON M-80W #293662263 for sale

TEL / TOKYO ELECTRON M-80W is a state-of-the-art prober designed for the on-site testing of semiconductor devices. It is widely used for testing high-performance semiconductor circuits such as analog and digital integrated circuits. TEL M-80W features an automated, semi-automatic probing equipment with adjustable pressure, giving maximal flexibility to the user. The prober is equipped with an 8-point physics-based probe adjustment system, allowing users to accurately measure contact resistance on the substrate with minimal electrical loss. This adjustment unit also customizable to the user's needs and is capable of scanning up to 500 sites in one cycle, reducing the overall testing time. The prober also features multiple different test modes such as contact mode, Kelvin mode and voltage mode. The contact mode is used for testing the on-resistance of the device while the Kelvin mode measures contact resistance between two different points. The voltage mode measures the voltage across two sites. This offers the user precise measurements of the device along with a comprehensive view of its performance. The prober is mated with a flexible XY scanning robot, enabling accurate positioning of the probe tip relative to the device. The robot is also designed with an automated, part-handling machine that eliminates human intervention when handling small components. In addition, TOKYO ELECTRON M-80W is equipped with a variety of safety features such as a noise cutoff setting that automatically stops the test when noise level exceeds a certain threshold, preventing any potential damage to the device. M-80W also comes with a fully integrated design, ensuring remarkably low maintenance cost and dependable performance. Through its modular design, the prober will be able to be upgraded in the future with additional features and equipment. By leveraging the sophisticated and reliable technology of TEL / TOKYO ELECTRON M-80W semiconductor prober, engineers are able to quickly and accurately measure their devices, reducing test time and increasing their overall test accuracy.