Used TEL / TOKYO ELECTRON M-80W #293662267 for sale

TEL / TOKYO ELECTRON M-80W is a high-precision prober designed for use in semiconductor wafer probing applications. TEL M-80W features a 300mm wafer scan range, a 5-axis probing stage, a rotary wafer stage, and a 2-axis sample stage. TOKYO ELECTRON M-80W also features a compact and lightweight design with a small footprint, allowing it to fit into cramped spaces. Additionally, M-80W has an internal expanding wafer chuck that can handle wafers of varying thickness. TEL / TOKYO ELECTRON M-80W has a high-performance motion control equipment that minimizes vibration and ensures smooth operation. TEL M-80W also has a vision-based inspection system which is capable of detecting defects as small as 10nm. Additionally, it can customize probe patterns and scan trajectories to better suit individual application requirements. TOKYO ELECTRON M-80W has an integrated computer control unit that allows it to be operated remotely, enabling it to be connected to networks and the internet. M-80W has been equipped with a wide array of probes and stages, enabling it to perform a variety of probing tasks. TEL / TOKYO ELECTRON M-80W has a multi-touch piezo probing machine which is capable of handling wafers up to 300mm in size. Additionally, it can perform accurate wafer-level scanning and defect detection. It also features a fine-pitch probing tool which is ideal for low-voltage probing applications. TEL M-80W is designed with a high level of accuracy. It has an accuracy of 1µm or less and a repeatability of 0.001µm or less. Additionally, it has a maximum probing speed of 50Hz. Additionally, TOKYO ELECTRON M-80W is equipped with safety features to ensure the safety of operators during use. M-80W is ideal for semiconductor wafer testing applications. It has a wide range of probes and stages which enable it to accurately detect and characterize wafer defects. Additionally, it has an integrated computer control asset which allows it to be operated remotely, making it an ideal choice for a wafer laboratory environment.