Used TEL / TOKYO ELECTRON MHF 6000 #9249400 for sale

TEL / TOKYO ELECTRON MHF 6000 is an electro-mechanical laminate probe station designed for on-wafer devices testing. It is the state-of-the-art tool for inspecting and testing the operation of a wide range of integrated circuits (ICs) and other semiconductor devices. The instrument is equipped with an automated three-axis probe station, which is capable of further probing and testing ICs and other semiconductor devices with precision and accuracy. TEL MHF 6000 is equipped with an automated three-axis drive equipment, which offers a high level of stability and accuracy. This system is capable of picking up and positioning ICs and other semiconductor devices with a precision of one-micron resolution for accurate testing. The unit also features an independent Z-axis drive, which allows the probe station to position probes even more precisely. In addition, TOKYO ELECTRON MHF 6000 features an advanced machine for monitoring electrical parameters during testing. This tool includes a digital voltmeter and lock-in amplifier, which are used to analyse and measure voltage, current and other electrical parameters accurately. The instrument also includes a thermal transducer, which is used to measure temperature levels during testing in order to protect the device from thermal damage. MHF 6000 is also equipped with an integrated network control unit which is used to program a series of parameters and settings. These parameters can include probe types, drive-line settings, output low-level thresholds and channel setting. This powerful network control unit is essential for accurate and efficient testing process. TEL / TOKYO ELECTRON MHF 6000 is also widely used in production testing due to its high precision and accuracy. The machine is designed to operate in a range of harsh conditions due to its industrial grade construction, which is resistant to dust, spikes in voltage and mechanical shocks. Finally, the comprehensive post-processing software suite provides users with an advanced inspection and analysis platform which aid in providing quick and accurate results.