Used TEL / TOKYO ELECTRON P-12 #293770058 for sale
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TEL Process 12, or TEL / TOKYO ELECTRON P-12, is a state of the art, high tech prober. It is designed to provide precise control of sample temperatures and contact force, allowing for better accuracy and repeatability in material and simulation testing. The sample temperature is controlled electronically with a PID circuit for accurate temperature control. It also provides simultaneous control of up to four heaters, allowing for maximum flexibility and control over the sample area. TEL P-12 implements a vertical plane with two axes of movement, a Z-axis and an X-axis, to allow for efficient and precise probing of samples of various sizes. The Z-axis is motor driven, allowing for smooth and precise vertical movements of up to 80mm. The X-axis is driven by a combination of manual and motorized keyboards to provide access to up to 25mm for easier sample probing. TOKYO ELECTRON P-12 also features an integrated motion controller, which enables precise and repeatable positioning in both the X and Y axes. This controller gives users enhanced control over sample probing and allows for more efficient and accurate representative probing of the material being studied. P-12 also integrates an advanced optical equipment for imaging of samples. This advanced system is designed to provide images of the tested materials in various light sources and angles, allowing for greater understanding of surface characteristics. This advanced unit also integrates a focused ion beam technology and scanning electron microscopes for more detailed analysis of the sample. The advanced control systems of TEL / TOKYO ELECTRON P-12 allows for maximum precision and repeatability when probing materials. The machine's combination of motorized Z-axis and manual X-axis platforms, as well as its advanced sensing and optical systems, make this model one of the leading professional probe models available. Through its precision and repeatability, TEL P-12 provides reliable results for material and simulation testing.
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