Used TEL / TOKYO ELECTRON P-12XL #293594868 for sale

TEL / TOKYO ELECTRON P-12XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 293594868
Prober CPU Board: VIP3 (Can be updated to VIP3A) Cleaning unit: WAPP GPIB Floppy Disk Drive (FDD), 3.5" Wafer table Network function Display: LCD Color touch screen, 10" Barcode reader Signal tower SACC OCR: Insight 1700 Card holder: Chroma docking Loader type: Loader / Left Cassette type: Cassette, 6" FOSB, 8" Chuck type: Hot temperature: +150 Golden and Ni, 8" Does not include: Hinge Inker Chiller Power supply: 220 V.
TEL / TOKYO ELECTRON P-12XL is an advanced prober designed for production testing of Semiconductor devices' electrical characteristics. It has been designed to the highest quality standards for reliable, precise and easy to use prober operations. The highly reliable tool is built from the ground up to give manufacturers the flexibility and accuracy needed for expert semiconductor device testing and characterization. TEL P12XL features an innovative probe head which is designed for maximum accuracy and reliability. The X-Y/Z/θ fine-move design provides unsurpassed accuracy for positioning the probes for high-speed measurements. The short stroke design gives operators more control during probing operations. TOKYO ELECTRON P 12 XL prober also features an automated wafer-guide equipment that precisely controls wafer position and focuses on repeatability and accuracy. This allows for comprehensive surface characterization of any given device and helps avoid defective or misaligned probes. The high-precision X-Y/Z/θ fine-move design utilizes a new dual-stage open-loop frictionless drive system with a zero backlash maximization structure. This structure ensures that the drive unit has greater stiffness and rigidity for increased accuracy and reduced variation in measurement results. P-12 XL also has built-in force sensors that allow for accurate measurement even in low vibration environments. This feature helps eliminate environmental noise, which may be a critical issue for precision testing operations. Multi-contact, ball-type probe technology provides high-speed handling of large number of probes and surfaces, while providing reduced electrostatic charging. TEL / TOKYO ELECTRON P 12 XL Prober includes TEL advanced Polygon Shake Reduction Machine (PSRS), which helps reduce vibration and distortion during probe contact. PSRS provides a high degree of accuracy and repeatability, so effectively increasing the accuracy of electrical measurements. TEL / TOKYO ELECTRON P12XL tool is also MIL-STD-810G certified, providing manufacturer's with additional peace of mind for their production operations. Overall, TOKYO ELECTRON P12XL is an advanced prober designed for accurate and reliable measurement of semiconductor device characteristics. With features such as X-Y/Z/θ fine-moves, automated wafer-guide asset, and Polygon Shake Reduction Model, P 12 XL provides the accuracy and performance required for active production testing and characterization of semiconductor devices.
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