Used TEL / TOKYO ELECTRON P-12XL #293605514 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 293605514
Prober Missing parts: Stage motor driver assembly Loader base box assembly Loader Z-motor Arm IOM Board ASU Camera assembly Bridge camera Up / Down matching camera - ASU Assembly WAPP Plate Mapping arm holder HDD Theta motor assembly VAC Sol lower arm.
TEL / TOKYO ELECTRON P-12XL lithography prober is an automated precision measurement equipment widely used in the semiconductor industry. It is designed to automatically measure and monitor the quality, uniformity and reliability of semiconductor devices and components at the submicron level. TEL P12XL is designed to gather and analyze data from as many as twenty-four devices simultaneously. It uses an advanced, non-contact measurement system with micro-lasers, optics and opto-electronics to capture the microscopic details of the devices. This enables it to accurately measure and monitor the performance of integrated circuits (ICs), thin-film transistors (TFTs), organic light-emitting diodes (OLEDs), and other semiconductor components with a high degree of precision, accuracy and repeatability. TOKYO ELECTRON P 12 XL is capable of measuring features as small as 0.2 microns and offers industry-leading throughput rates. Its automated unit consists of a high-precision wafer-handling machine, a prober stage, a sample stage and a vision tool. The wafer-handling asset allows P12XL to quickly and accurately move wafers in and out of the prober stage and sample stage. The proprietary Sample Compensation Model (pSCS) automatically compensates and positions the samples, as needed, to ensure reliable and repeatable results. The vision equipment utilizes proprietary algorithms and optical magnification to detect and analyze surface features, including defects such as chips, breaks, shorts and opens. The system measures resistivity and optical parameters such as light intensity, uniformity and reflectivity. This capability allows TEL P-12XL to perform delicate inspections quickly and accurately, ensuring that every device meets stringent industry standards. In addition to its advanced metrology and inspection capabilities, P-12 XL also offers a range of functions for data analysis and presentation. The unit is equipped with an integrated data acquisition and archiving machine, which records and stores the data gathered during automatic measurements and inspections. The tool's user-friendly graphical user interface (GUI) provides an intuitive platform for reviewing and interpreting results. TEL / TOKYO ELECTRON P12XL is an advanced prober designed to reliably and precisely measure and monitor semiconductor devices and components at the submicron level. Its sophisticated design and automated asset offer outstanding throughput and accuracy, allowing users to rest assured that their device quality is up to par.
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