Used TEL / TOKYO ELECTRON P-12XL #293605515 for sale
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ID: 293605515
Vintage: 2002
Prober
Missing parts:
Stage motor driver assembly
Loader base box assembly
Main power supply
Loader Z-motor
IOM Board
Arm IOM board
ASU Camera assembly
Bridge camera
Up / Down matching camera - ASU assembly
WAPP Plate
COGNEX OCR Camera
Mapping arm holder
Mapping arm
HDD
Theta motor assembly
Temperature controller
2002 vintage.
TEL / TOKYO ELECTRON P-12XL Prober is a highly advanced, 8-inch metrology/probing equipment with state-of-the-art optical and control capabilities, designed to provide superior inspection results. This prober is equipped with a high-precision, 5-axis wafer-handling robot and a 12-station, multi-purpose, alignment/measurement platform. TEL P12XL Prober has a built-in optical system that can measure directly with a sub-micrometer repeatability in the X, Y and Z axes. An innovative design feature allows for rapid setup of the unit, with several user-selectable options available to optimize scanning speed and accuracy. The machine has several unique features to facilitate the most accurate measurements, including 6-channel color CCD cameras for high-resolution imaging. This tool includes high accuracy, in-situ stage and wafer slot calibration, allowing for very precise and repeatable measurements of multiple devices on the same wafer. TOKYO ELECTRON P 12 XL Prober can be integrated with TEL "MyProber" measurement and analysis asset, allowing for automatic control and easy-to-use data analysis capabilities. The MyProber model includes a number of tools for quickly analyzing and displaying acquired data, including data comparison and report generation. In addition to its metrology capabilities, TOKYO ELECTRON P-12XL Prober has several other features that allow for efficient and accurate inspection of metrology and device defects. The prober has both infrared and optical imaging systems that can quickly pinpoint defects and bridge fractures, as well as a powerful 12-axis high-precision alignment engine for ensuring accurate placement and handling of the wafer. The prober also includes the "Quick-View" feature, which can quickly and accurately measure up to 4 independent fields. This function allows for fast, user-friendly wafer inspection by efficiently displaying the ranges and statistics of each field, as well as providing an overall summary of the wafer. TEL P-12 XL Prober is a unique, multifunctional equipment that provides essential metrology and inspection capabilities for the most demanding measurement requirements. With integrated optical and control capabilities, TOKYO ELECTRON P-12 XL Prober enables fast setup, accurate measurements, and quick defect analysis for high-precision test and inspection applications.
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