Used TEL / TOKYO ELECTRON P-12XL #293815997 for sale

TEL (TOKYO ELECTRON) TEL / TOKYO ELECTRON P-12XL Prober is a state-of-the-art wafer probing equipment designed for high-speed wafer-level testing. TEL P12XL is capable of testing a variety of wafer sizes up to 12 inches and can handle up to 12 probes to perform single or added simultaneous datapoint throughput testing. Probes can be configured for various combinations for a variety of applications. The system features a highly reliable prober arm with vertical, horizontal and rotary motion that enables probe tests with accurate and repeatable positioning and movement. Integrated vertical, horizontal and rotary stage mechanisms provide high accuracy and repeatability when testing wafers of different sizes and shapes. Additionally, the unit features a high-resolution micro-stepping control with repeatable positioning and servo feedback to provide high-precision probing results. TOKYO ELECTRON P 12 XL is designed to provide greater uptime and reduce downtime with its optimized operation, including an automatic self-calibration feature. The unit features integrated anti-vibration dampers that absorb vibration and minimize acoustic noise, helping to ensure quiet and consistent operation. The prober's integrated environmental control machine is designed to help maintain wafer stability and reduce humidity-induced failure during testing. TEL / TOKYO ELECTRON P12XL includes an in-tool heater that maintains wafers at a specified temperature, helping to ensure the performance accuracy of the device. The asset is also equipped with an efficient air filtration and dust collection model to remove foreign particles and improve repeatability of test results. Finally, P-12XL features closed loop control technology to accurately monitor and adjust the speed of the prober arm and stage. The closed loop feedback control equipment monitors and adjusts the position of the stage mechanism for precise and repeatable positioning and movement. Additionally, the system includes advanced software tools for automated wafer positioning, testing and result printing. These features, along with the unit's built-in protection against environmental and mechanical shock, allow for precise wafer probing with outstanding repeatability and reliability.