Used TEL / TOKYO ELECTRON P-12XL #293815999 for sale
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ID: 293815999
Wafer Size: 12"
Vintage: 2004
Prober, 8"-12"
Front Opening Unified Pod (FOUP)
(2) Loader arms
2004 vintage.
TEL / TOKYO ELECTRON P-12XL is a multi-purpose prober designed for precise, high-performance test purposes, suitable for a variety of test applications. This prober is equipped with a 10-axis measurement system that enables precise positioning of the test piece. This allows the user to test various flat-panel displays (OLEDs, LCDs), substrates, and other small parts in a single tool. In addition, with its integrated vacuum chuck, TEL P12XL can also be used for wafer bump testing, as well as for high-density product tests such as high-level integrated circuits. In addition, TOKYO ELECTRON P 12 XL also features a highly accurate, direct-reading scale for easy accuracy and repeatability. This helps ensure that the device is always aligned and making accurate measurements. Furthermore, TOKYO ELECTRON P12XL has a maximum throughput of 200mm2/min, making it suitable for high-volume test scenarios. Additionally, it has an IC tester head that is capable of reaching up to X/Y accuracy of 10μm and repeatability of 5μm. This feature further enhances the accuracy of the tests and allows for more precise product tests. TOKYO ELECTRON P-12XL also has several built-in self-diagnostics to ensure reliable operation. For example, it has a heating feature for the chuck head which prevents deformation of the chuck surface and ensures that the device is always making accurate measurements. Overall, TEL / TOKYO ELECTRON P-12 XL is an ideal prober for making precise, high-performance test measurements. With its 10-axis measurement system and a wide range of tests possible, P12XL is suitable for a wide range of applications, with its IC tester head allowing for more precise testing. Additionally, its robust self-diagnostics further enhance its reliability, making it a great choice for testing needs.
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