Used TEL / TOKYO ELECTRON P-12XL #293816000 for sale

TEL / TOKYO ELECTRON P-12XL is a high-precision prober for microelectronic devices, offering the best combination of speed, accuracy, and throughput for micro-scale test, analysis, and evaluation of wafer-level semiconductor components. TEL P12XL uses a 1.2 μm XY manual prober with advanced MSL monitoring, enabling high-precision chip-on-wafer measurements. The prober also features a low-vacuum high-precision probe, an automatic tip calibration equipment, a wide-range probe height adjuster, and a manual probe-contact system. The prober can be customized to accommodate specific needs, enabling quick and easy setup. TOKYO ELECTRON P 12 XL is designed for high-precision applications and offers accurate mapping of electrical characteristics for small devices. The prober also features an advanced repeatability and stability unit, with a maximum resolution of 1 μm. It can be used for both pre- and post-probe measurements, enabling high-accuracy device testing. The prober is equipped with an auto-measurement machine, which provides real-time data analysis and plotting capabilities. P-12 XL features a scanning electron microscopic probe, which can efficiently measure surface characteristics and subsurface features of semiconductor devices. The prober also features a special virtual shutter function, which allows for dynamic JPEG imaging, enabling the inspection of wafer topography and other analysis of the surfaces of wafers. TOKYO ELECTRON P12XL is equipped with a variety of other useful features, including software for optimal operation and control, and a wide range of options for data acquisition and analysis. All this allows for a high throughput and accurate testing of semiconductor components. Furthermore, the prober is extremely easy to use, and can be quickly set up for measurement of a variety of devices. This makes TOKYO ELECTRON P-12XL an ideal prober for fast, accurate and reliable testing.