Used TEL / TOKYO ELECTRON P-12XL #293816001 for sale
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ID: 293816001
Wafer Size: 12"
Vintage: 2002
Prober, 8"-12"
(2) Front Opening Unified Pods (FOUP)
(2) Pincettes
CR385PH High Temperature Thermal Device (HTTD)
D250 Chiller
Linear Time-Invariant (LTI) unit
2002 vintage.
TEL / TOKYO ELECTRON P-12XL Prober is a highly accurate wafer probing equipment designed for precise measurement of microelectronic components. As a high-performance system, the Prober features a large workspace for measuring wafer sizes ranging from 100mm to 300mm and 200mm to 600mm. TEL P12XL Prober can measure a wide range of characteristics such as line width, spacing, contact resistance, thickness, and external contacts. The Prober provides a robust design which includes a high-precision auto-centering rotation unit, a scrub drive that adjusts the center of rotation, and a low-noise X-Y-Z stage and scanning head. This ensures accurate measurements even at the lowest of noise levels, ensuring reliable data and precise results. The Prober is also equipped with an advanced wafer probing machine with powerful software for complete control of all probing functions. The state-of-the-art software provides a graphical user interface and can be easily operated without any prior proficiency. The powerful software also assists in coordinating, managing and controlling the probing process, providing operators with quick and efficient access to essential information. TOKYO ELECTRON P 12 XL Prober delivers high-precision measurements with a 4μm minimum separation value and a 0.05 mil accuracy. It is equipped with a state-of-the-art scanning algorithm and a wide range of sensing heads and probes, enabling high-precision measurements of a variety of electronic components. The multiple tool kit also allows operators to quickly and effectively access the right probe and take accurate measurements. The Prober is designed to be easy to install and maintain, while minimising downtime and maximising throughput. An optimized air pressure and temperature tool ensures that particles are prevented from entering the work area, providing optimal operational conditions. The Prober also features active top plate cleaning capabilities which enable fast and efficient cleaning of the wafer before and after probing. Overall, TEL / TOKYO ELECTRON P12XL Prober is an efficient and reliable wafer probing asset designed to meet the stringent requirements of modern microelectronic device testing. Its robust design, consistent performance, and advanced software allow it to deliver precise and accurate measurements with maximum reliability and efficiency.
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