Used TEL / TOKYO ELECTRON P-12XL #293816007 for sale
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ID: 293816007
Wafer Size: 12"
Vintage: 2002
Prober, 8"-12"
Dual load port
CIM: RS232
(2) Front Opening Unified Pods (FOUP)
(2) Pincettes
Low Temperature Interface (LTI) unit
CR385PH High Temperature Thermal Device (HTTD) unit
D250 Chiller
SH Communication error
2002 vintage.
TEL / TOKYO ELECTRON P-12XL is a wafer prober device used for testing and analyzing the electrical characteristics of semiconductor devices. This tool effectively transfers products from one area to another, ensuring quality control on all of the products. By monitoring the testing process in real-time, it ensures accuracy and reliability. TEL P12XL features an automated testing system, which allows it to simultaneously test a large number of devices in a single probe station. The device is equipped with multiple General Purpose Interface Buses (GPIB) to allow communication with multiple computers, making the data gathering during testing more efficient and accurate. The prober is capable of testing a wide variety of devices, ranging from substrates to integrated circuits. The instrument has an adjustable probe pressure and temperature settings, as well as a range of electrical test capabilities, including resistance and capacitance measurement, current and voltage measurement, power on and off control, and tracking of individual devices. Furthermore, TOKYO ELECTRON P 12 XL also offers advanced sensing capabilities such as photoelectric sensing, area scan sensing, and a nanometer-level rapid scanning system. This ensures the precise location of each device and allows for the destruction of only defective devices. The reliable and accurate testing process provided by TOKYO ELECTRON P-12 XL results in the development of high-quality semiconductor products. It is a valuable tool for research and development of new devices, as well as for quality assurance in semiconductor manufacturing.
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