Used TEL / TOKYO ELECTRON P-12XL #293816009 for sale

TEL / TOKYO ELECTRON P-12XL Prober is an advanced electrical testing platform for integrated circuits, providing accurate and repeatable testing at the semiconductor wafer level. It has an advanced layout that is highly compatible with the industry standard specifications of pin-type semiconductor testing sockets. It is designed to support a wide range of electrical testing requirements. The prober features a large working area, which ensures a generous amount of space to accommodate a wide range of wafer sizes, as well as support a variety of experiments. It also has a broad range of testing capabilities, including measurements of current-voltage characteristics and capacitance-voltage measurements. Other features include a high insensitivity to temperature variations, high repeatability, an adjustable sample size, superior linearity, and an ability to accurately measure sample sizes as small as ten microns. TEL P12XL contains a built-in digital signal processor (DSP) which enables accurate frequency measurement, and auto-scaling of data. It is also equipped with a high-speed motor for accelerated movement of the test head, and includes a built-in safety interlock. This prober can also measure characteristics of mounted passive parts such as inductors, resistors and capacitors, as well as other small-signal semiconductor devices. TOKYO ELECTRON P 12 XL allows for simple set-up as well as easy maintenance. It utilizes a user-friendly, menu-driven user interface, featuring robust graphing and testing capabilities, as well as a variety of controls. A variety of parameters can be adjusted to customize the test results to the specific needs of the device manufacturer. Furthermore, it features a built-in test cell heater, preventing condensation under low ambient temperatures. In sum, TEL / TOKYO ELECTRON P 12 XL prober is an extremely helpful and versatile instrument, providing accurate and repeatable testing of a wide range of semiconductors and integrated circuits. Its advanced features ensure a reliable testing environment, with robust graphing and data processing capabilities, and the power to quickly and accurately measure the electrical characteristics of a variety of samples.