Used TEL / TOKYO ELECTRON P-12XL #293816011 for sale

TEL / TOKYO ELECTRON P-12XL is a prober for use in various semiconductor characterisation and measurement applications. The prober features advanced features such as ultra-light and highly responsive XYZ stages, with integrated cross-corrrection, making it ideal for high-precision, high-throughput wafer probing applications. Onboard technolog such as advanced image analysis, mix-mode probing, and noise measuring systems provide superior analytical applications. The prober has a small footprint and a clean design, allowing it to be easily integrated into existing infrastructures. TEL P12XL has a temperature-stable operation environment, with an adjustable temperature range of 4-120°C. A built-in feature allows automatic adjustment of the temperature to the user's specifications. The prober comes with a variety of probe cards, probes and actuators, enabling optimized sampling and accurate data acquisition. TOKYO ELECTRON P 12 XL offers several features for high-performance results. The prober's ultra-light and highly responsive XYZ stages can work together to track and analyse complex patterns quickly and accurately. Integrated cross-correction ensures that the prober functions accurately at various points during continuous stepping. This makes the prober especially useful for high-precision, high-throughput wafer probing. Other advanced features on P 12 XL include mix-mode probing, enabling simultaneous contact and non-contact measurements. The prober also offers image analysis, allowing it to measure subtle differences in electrical signals resulting from device effects on failure conditions or process variations. It also offers a noise measuring system, which can be used to diagnose and address noise issues. TEL / TOKYO ELECTRON P-12 XL is an ideal prober solution for a variety of applications, ranging from electrical testing to failure analysis and process monitoring in the semiconductor industry. It is an ideal choice for high-precision and high-throughput wafer probing applications.