Used TEL / TOKYO ELECTRON P-12XL #293828518 for sale
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ID: 293828518
Wafer Size: 8"-12"
Prober, 8"-12"
Type: Fully automatic
Applications: Wafer-level parametric, functional, and reliability testing
Wafer chuck: Precision vacuum chuck with optional temperature control
Chuck temperature range: -60°C to +200°C
Motion system: Precision X-Y-Z-θ servo-controlled positioning
Positioning accuracy: ±1 µm (X/Y)
Z-Axis accuracy: ±0.5 µm
Alignment: Automatic wafer mapping with optical pattern recognition
Probe interface: Compatible with parametric and functional probe card test heads
Control system: Fully automatic operation with integrated wafer mapping and probe alignment
Utilities: Clean dry air (0.5-0.7 MPa) and vacuum
Power supply: 200-240 VAC, 50/60 Hz, 1.5–2.5 kVA.
TEL / TOKYO ELECTRON P-12XL prober is a professional-grade testing device designed for conducting advanced surface analysis. it is used primarily in semiconductor production, material analysis, semiconductor device testing and packaging. TEL P12XL includes an air bearing die placer for COT packages that can attain a quick initial placement with an accuracy of ±0.25um. Vertical-drive motion technology ensures stable and accurate positioning. This is especially important for low-k dielectric analysis sample, which requires precise and repetitive alignment. TOKYO ELECTRON P 12 XL also features a TEL optimized load frame which provides best-in-class Force-Voltage-Current (FVC) characterization capability. It enables fast, precise, long-term reliability testing of devices. The 5-axis system provides greater positioning flexibility and vibration resistance than traditional 3-axis probers. The versatile P12XL is capable of performing various types of electrical tests. Among other tests, it can perform top-side resistivity and resistance testing, floating-base resistivity, Small Form Factor (SFF) testing, short-interval thermal cycling and transient thermal testing. TEL / TOKYO ELECTRON P 12 XL also comes with an optical microscope that facilitates proximity and localized non-contact imaging (LN2I). In addition to its advanced testing capabilities, P 12 XL boasts significant improvements in speed and accuracy. Its scan field allows for a high-speed, high-precision (<0.1um accuracy) die placement. An additional safety feature allows the operator to pause and validate results in between tests. This is especially helpful for longer testing cycles. The overall design of TOKYO ELECTRON P12XL has been improved relative to previous models. The enhanced mechanisms promote stability and durability even in high-vibration environments. The robust construction ensures consistent and reliable testing results. Lastly, the microcontroller architecture enables improved accuracy, even when mounted on an unstable bench. In conclusion, TEL / TOKYO ELECTRON P-12 XL is a versatile, high-performance prober that provides great accuracy, speed, and reliability. It is ideal for advanced surface analysis and provides the operator with robust, reliable testing results.
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