Used TEL / TOKYO ELECTRON P-12XL #9089358 for sale

TEL / TOKYO ELECTRON P-12XL Prober is a highly advanced multi-functional material measurement equipment designed for research and development in various fields. This system is capable of measuring thin film samples with high accuracy, as well as providing an array of unique features to assist in research. TEL P12XL is equipped with a special high-resolution imaging unit to ensure precision and repeatability of measurements. The imaging machine consists of a probe head, micro-shape sensor, and spectrometer to detect different physical properties of the thin film sample, such as trace element composition and refractive index. TOKYO ELECTRON P 12 XL also utilizes a multistage target tracking mechanism to keep its probe head accurately positioned within a micro pre-defined measuring area. The probe head is designed for a wide range of thin-film measurements, such as surface roughness evaluation, surface average roughness measurement, X-ray thickness measurement, X-ray reflectivity measurement, X-ray diffraction analysis, and surface analysis. In addition to its high-precision imaging tool, TEL / TOKYO ELECTRON P12XL is equipped with a powerful multiple stage stress detection sensor. This asset can detect any strain induced by processing or stress at the material surface and measure with an accuracy of up to 10-8 micron of PV hysteresis in thin-film samples. The stress detection sensor is prepared with a variety of surface materials for broad application coverage in surface stress operation. TOKYO ELECTRON P-12XL also uses a specially designed material probe that provides high stability and repeatability in measurement. This probe is capable of detecting any deformation of the sample, such as surface expansion or contraction, or the partial deformation of the sample in the area of interest. P-12XL also features a high-precision temperature controller, to ensure accurate measurement results in a wide temperature range. All these features combine to deliver P-12 XL's high-performance measurements with excellent data reproducibility. TEL P 12 XL is capable of handling both long-term and short-term measurements, as well as high-temperature events. All measurements taken with this model are then processed with an intuitive graphical user interface, that provides users with easy to understand interpretations of the data. The equipment also includes a library of standard materials, which enables users to easily compare relevant data from their samples with accepted benchmark data. In conclusion, TEL / TOKYO ELECTRON P 12 XL Prober is a high-end material measurement system designed for research and development. This unit is capable of accurately measuring thin film samples, and provides a variety of features, such as a high-resolution imaging machine, a multistage target tracking mechanism, a stress detection sensor, and a high-precision temperature controller. The intuitive graphical user interface and library of standard materials ensures that users are able to quickly and easily compare their data with accepted benchmarks.