Used TEL / TOKYO ELECTRON P-12XL #9096850 for sale

TEL / TOKYO ELECTRON P-12XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9096850
Wafer Size: 12"
Vintage: 2001
Prober, 12" 2001 vintage.
TEL / TOKYO ELECTRON P-12XL prober is a high-precision wafer probing machine commonly used in semiconductor research and development laboratories. It is most often used for testing the reliability and performance of integrated circuits during the design, analysis, and prototyping processes. The prober consists of a stage with a pair of electrostatic chucks, which can be loaded up with a variety of probes and testing equipment. The load and unload of the wafer is achieved through an automated procedure. The stage can accommodate various sizes and types of substrates, and the chucks can be adjusted for varying test requirements. The prober also features a set of high precision motion and motion control components, as well as an integrated thermal management system, allowing for accurate and stable testing conditions. The prober utilizes a scanning XY paradigm, performing both coarse and fine movement of probes across the wafer surface, while simultaneously controlling the force of the probes themselves. For further accuracy and repeatability, the prober is also equipped with a 3-dimensional vision system, and an optical microscope that allow for placement of probes and test points with an accuracy of up to two microns. The microscope also enhances the probing accuracy. The prober provides an automated testing interface through its web-based software, which offers functions such as managing test parameters, execution, analysis, and reporting. The ability to remotely control the prober is also integrated, allowing for remote access and monitoring. The prober has proven to be simple and intuitive to operate, while also providing a high level of flexibility and accuracy. TEL P12XL prober is suitable for both research and production environments, and is designed to operate in a 24/7 mode. It is considered one of the most cost effective tools in the semiconductor industry, allowing customers to achieve a high degree of repeatability, coupled with high-precision testing results.
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