Used TEL / TOKYO ELECTRON P-12XL #9102217 for sale

TEL / TOKYO ELECTRON P-12XL is a prober specifically designed to meet the demands of semiconductor circuit board testing. It is a versatile, high-precision instrument designed for testing and analyzing semiconductor circuits. TEL P12XL is equipped with up to 1,024 probes and can be used on substrates of up to 300 mm in diameter. TOKYO ELECTRON P 12 XL prober offers a range of advanced feature sets to provide reliable test results and accurate analysis. It has a touch screen interface that is designed for ease of use and provides a range of diagnostics for in-depth testing. P 12 XL also features a fully automated calibration function that ensures the accuracy and repeatability of the probes. TOKYO ELECTRON P-12 XL utilizes a high-precision non-contact based measurement system, allowing for accurate testing in even the most demanding standoff conditions. P12XL prober is equipped with powerful image processing and analysis capabilities. The system is capable of analyzing images at speeds of up to 1,000 frames per second. This allows for high-speed image analysis and ensures the accurate detection of anomalies and malfunctions. TEL / TOKYO ELECTRON P12XL also features an integrated library of fault pattern recognition algorithms to enable automated failure analysis. TEL P-12XL provides a powerful, versatile test platform for probing and analyzing semiconductor circuits. The system is designed to be durable in operation and can be used in both laboratory and production environments. It is also equipped with thermal expandable probes to accommodate board shrinkage from temperature fluctuations. TEL / TOKYO ELECTRON P-12 XL is a reliable, accurate, and versatile prober designed to meet the demands of semiconductor circuit board testing. It provides powerful image processing and analysis capabilities, as well as automated fault recognition. TEL P-12 XL can be used in both laboratory and production environments and is capable of probing a wide range of substrates. It is a powerful tool for testing and analyzing semiconductor circuits.