Used TEL / TOKYO ELECTRON P-12XL #9104133 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9104133
Wafer Size: 12"
Vintage: 2005
Analysis prober, 12" Right loader 2005 vintage.
TEL / TOKYO ELECTRON P-12XL is a prober developed by TEL Ltd. It is a positioning equipment designed to accurately and reliably inspect and test finished semiconductor chips. TEL P12XL Prober is based on a single-axis, four-sided chuck and vertical alignment drive technology. This system is capable of high-speed probing, excellent accuracy, and responsive control for precise measurements and process testing. TOKYO ELECTRON P 12 XL can handle wafers up to 12 inches in diameter and feature multi-zone alignment for faster loading and unloading. The probes used on TOKYO ELECTRON P-12XL are mass produced for reliable and reproducible measurements. The probes are precision calibrated to maintain maximum accuracy and are automatically changed to the desired position. The alignment algorithms ensure that the positioning is accurate and repeatable. The platform also features a unique vision unit that allows it to automatically detect and measure probe position, while other vision based systems are manually interfaced. TOKYO ELECTRON P12XL platform is designed to handle a variety of wafer orientations and substrates. The platform enables both horizontal and vertical probing along with probe station scanning. It can be configured for rapid move, pulse test, and scanning probe measurement. The platform is equipped with a dedicated wafer adapter to provide adaptive wafer clamping. The powerful software combined with the multi-position alignment of the probes provides a sophisticated and reliable probing machine. With its unique features and advanced capabilities, P12XL Prober provides accurate, efficient, and repeatable probing at the highest levels of accuracy. Its sophisticated software, quality engineering, and efficient tool design enable it to deliver unparalleled performance, meeting or exceeding today's stringent requirements. This platform is ideal for testing and evaluation of finished semiconductor wafers.
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