Used TEL / TOKYO ELECTRON P-12XL #9115797 for sale

TEL / TOKYO ELECTRON P-12XL is an ultra-high-precision prober designed for probing and testing of advanced semiconductor integrated circuits. It is capable of handling wafers, dies and other devices of up to 12 inch in diameter. TEL P12XL is engineered to support manual and automatic device testing using advanced vision and force control technologies. Its multi-zone vacuum chuck supports simultaneous thermal and mechanical probing on the same device, while its integrated vision and optical light systems allow for the automatic alignment of the sample to the faces of the chuck. The prober features independent vertical, horizontal and azimuthal motion systems which are designed to minimize motion-induced sample damage, resulting in uncompromised accuracy and resolution. The coaxial probe arm makes possible vertical and horizontal probing of multiple device locations in a single motion. The arm is also equipped with a vision and force control system that ensures accurate and repeatable positioning even in extreme conditions. In addition, TOKYO ELECTRON P 12 XL supports a variety of probing techniques and technologies, including edge contact pad probing, ribcontact pad probing, double pad probing and molded contact probing. The prober also features a unique micro stitch scheme that provides a more uniform current profile over the whole range of the device than other technologies, thus ensuring a higher level of performance. Finally, the prober is equipped with a dedicated software which offers a wide range of functions and data exchange capabilities. The software allows operators to define test configurations, check probe data and generate detailed test reports. Furthermore, the system is actively monitored and adapted to new technologies and features through an advanced capability assessment system.