Used TEL / TOKYO ELECTRON P-12XL #9115798 for sale

TEL / TOKYO ELECTRON P-12XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9115798
Vintage: 2010
Prober VIP4 Board 2010 vintage.
TEL / TOKYO ELECTRON P-12XL is a prober used for the testing of ICs and semiconductor devices. This prober employs several features and technologies intended to provide accurate, repeatable and efficient testing of a wide variety of semiconductor components. TEL P12XL features a low-vibration, low-force probing equipment that enables quick, accurate and consistent results. This system consists of an X-Y linear motor drive, a Z-axis piezo drive, and a high-precision precision alignment unit. The X-Y linear motor drive is capable of accurately positioning the tip of the probe to within 0.0005 mm. The Z-axis piezo drive provides the force necessary to safely probe into the sample material without causing damage. TOKYO ELECTRON P 12 XL also features adjustable pad-level settings and a touchscreen interface, allowing for the easy adjustment of settings to suit the individual requirements of each test. With this adjustable pad-level, operators can control the maximum allowable force applied to the sample, enabling delicate probing. The touchscreen interface provides a graphical user interface (GUI) allowing for simple yet powerful programming capabilities. Finally, TEL P-12 XL is equipped with built-in sensors for temperature and process feedback, allowing for better consistency and repeatability of results. P 12 XL is also able to capture probe-to-pad locations with high precision to prevent errors from arising due to inadequate port alignment. Overall, TEL / TOKYO ELECTRON P 12 XL prober is an advanced tool for testing ICs and other semiconductor devices. It is capable of providing results with unprecedented speed, accuracy and consistency thanks to its low-vibration, low-force probing machine, adjustable pad-level settings, touchscreen interface, and built-in sensors. It is also extremely easy to use. As such, it is an excellent choice for any semiconductor testing applications.
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