Used TEL / TOKYO ELECTRON P-12XL #9131736 for sale
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ID: 9131736
Wafer Size: 12"
Vintage: 2002
Wafer prober, 12”
Gold
Hot
GP-IB Cable
Head plate
Gas-spring on headplate
Standard monitor
WAPP-20K with brush
Card holder
Manipulator
Wafer table
Printer
OCR: KLA P8-Zoom
SACC: 200/300
Boards:
147-CON
VIP3
GP-IB
TVB9003-1316
PST-STD
PST-OPT
Loader driver
SIO
Voltage: 200 Volts
Frequency: 50/60 Hz
Single phase
2002 vintage.
TEL / TOKYO ELECTRON P-12XL prober is a versatile, high-performance wafer prober machine with a sophisticated, user-friendly design. It is well-suited for a wide range of electronic and semiconductor testing and characterization applications. TEL P12XL is built with a dual-axis vertical stage and a high-speed X/Y stage that provides stepper motor control for fast and accurate probing of wafers at up to 8,500 flat probes per second. The high probe accuracy of TOKYO ELECTRON P 12 XL (less than ±2µm) ensures repeatable results for any device parameters measured. TEL / TOKYO ELECTRON P-12 XL features an efficient thermal platform designed to handle up to 300 wafer substrates. Moreover, TOKYO ELECTRON P-12XL has an advanced vacuum chuck system to securely hold wafer during the probing process. This system allows a large-area device to be probed without any danger of physical damage. An automated mechanical end effector allows for independent control over each probe's lifting and latching position, greatly enhancing the flexibility of your process. Additional features include a built-in memory card which enables data to be stored locally or transferred off-site easily. This makes TEL P-12XL an ideal solution for production and engineering environments that require high-throughput and quick turn-around of results. To ensure maximum reliability and performance, the motor modules and controllers of TEL P 12 XL have a redundant architecture to keep all functions running. The user interface of P-12XL utilizes LCD screens and membrane switches to provide a user-friendly experience. All these features make P 12 XL an ideal solution for various electronic testing and characterization needs.
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