Used TEL / TOKYO ELECTRON P-12XL #9131741 for sale
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ID: 9131741
Wafer Size: 12"
Vintage: 2001
Prober, 12”
Gold
Hot
GP-IB Cable
Head plate
Gas-spring on headplate
Standard monitor
WAPP-20K with brush
Card holder
Manipulator
Wafer table
Printer
OCR: KLA P8-Zoom
SACC: 200/300
Air and vacuum: Fitting
Monitor type: Standard
Single phase
Boards:
147-CON
VIP3A
GP-iB
TVB9003-1316
PST-STD
PST-OPT
Loader driver
SIO
Frequency:
Standard: 50/60 Hz
Metric: 50/60 Hz
200 V
2001 vintage.
TEL / TOKYO ELECTRON P-12XL Prober is a highly advanced automated testing equipment used in IC and device fabrication processes. It is used to measure and verify electrical characteristics of ICs, enabling accurate diagnostics for a wide range of device types. TEL P12XL Prober features advanced technology integration and process automation, which enables it to run multiple processes and measure multiple samples simultaneously. At the heart of the system is an advanced robotic arm and camera unit, which is able to accurately pick up, locate and place IC chips onto the prober. The prober is equipped with three different measurement fanout probe cards, each with its own capability and application. The W12-PRCF probe head is designed for semiconductor applications and is capable of measuring up to 30,000 probes per hour. The W12-PCST probe head is designed for TFT controller and transistor applications and is also capable of measuring up to 30,000 probes per hour. The W12-T0T8 probe head offers advanced performance in TFT and OLED applications, and is capable of measuring up to 8 probes per second. TOKYO ELECTRON P 12 XL Prober also incorporates an ultra-high speed parallel signal analyzer that can measure 1,000 signals per millisecond, allowing it to measure and assemble devices in less time than ever before. For testing multiple units simultaneously, TEL / TOKYO ELECTRON P12XL has a parallel measurement device driver which allows multiple probes and probes to be used in unison to measure multiple IC chips simultaneously, greatly improving process efficiency. P-12XL also features a number of connectivity options, including Ethernet, Wi-Fi and USB2.0, allowing it to be used in conjunction with a variety of other systems, making it a versatile, reliable and highly advanced prober solution. In addition, TEL P 12 XL Prober is highly programmable, allowing users to control the prober and customise their testing processes with ease. The machine is designed for easy maintenance, allowing for easy replacement and repair of parts when necessary. Overall, TEL / TOKYO ELECTRON P 12 XL Prober is a powerful, reliable and highly advanced automated testing tool that is capable of performing detailed testing of ICs, ensuring accurate diagnostics, increased process efficiency and improved device fabrication.
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