Used TEL / TOKYO ELECTRON P-12XL #9131742 for sale

TEL / TOKYO ELECTRON P-12XL is a fully automated prober designed for the efficient testing of semiconductor chips and devices. It has the capability to adapt to testing of a wide variety of semiconductor device types and sizes, and is designed to handle a wide range of wafer size from small pieces to standard and large diameter wafers. The prober has an Advanced Automated Alignment System (AAS), which allows the device to be precisely aligned and aligned quickly. In addition, the device has a precision alignment mechanism which enables it to accurately and more rapidly measure and calibrate each set of probing positions. The prober also utilizes advanced temperature sensors and computer-controlled elements, allowing it to accurately and consistently measure and calibrate temperature during testing. As such, it is able to achieve stable testing conditions and shorten the duration of debug cycles. TEL P12XL also offers a multi-site testing capability. For each positioning site, four probes are available and are arranged at 90-degree intervals. This allows for simultaneous testing of four sites, making it possible to overlap operations and increase throughput. Furthermore, the device's auto-calibration feature can be used to ensure stable measurements regardless of differences in temperatures and environments. The prober also includes an automated contact check feature which is capable of recognizing defective contact and automatically stopping a process at the problem sites. This ensures accurate and efficient testing of wafers and devices. A comprehensive, user-friendly software package is available which allows the user to customize their testing environment, keep and review historical data, and compare and optimize test results. Overall, TOKYO ELECTRON P 12 XL prober offers a reliable, cost effective, and automated testing solution for a variety of semiconductor chips and devices. It is able to accurately, quickly, and consistently measure and calibrate temperatures and device parameters, offers a multi-site testing feature, and includes an automated contact check system for increased accuracy and throughput.