Used TEL / TOKYO ELECTRON P-12XL #9131789 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9131789
Wafer Size: 12"
Vintage: 2001
Prober, 12" Gold Hot Head plate Gas-spring on headplate Standard monitor WAPP-20K with brush Card holder Manipulator Printer Wafer table SACC: 200/300 OCR: KLA P8-Zoom Air and vacuum: Fitting Monitor type: Standard Boards: 147-CON VIP3A GP-IB TVB9003-1316 PST-STD PST-OPT Loader driver SIO Frequency: Standard: 50/60 Hz Metric: 50/60 Hz Single phase 200 V 2001 vintage.
TEL / TOKYO ELECTRON P-12XL prober is an automated wafer probing machine designed for highly accurate thickness measurement and dielectric resistance test in IC research, production and R&D testing. It is an advanced, flexible and reliable equipment with an intuitive and user-friendly interface. This system offers a fully-automated and easy-to-use platform for wafer probing applications, and includes the world's smallest air gap for high-precision measuring and analyzing. TEL P12XL prober provides a fully-transparent platform for fast, accurate, and repeatable test results. This prober can measure and analyze ICs with a sample size up to one hundred fifty mils, and can also handle eight-inch (200 mm) and twelve-inch (300mm) wafers. It is equipped with a high-performance rotary sample stage that can be integrated with various wafer loaders. This sample stage provides the ability to move in all three axes of rotation, guaranteeing excellent positioning accuracy. TOKYO ELECTRON P 12 XL prober features three probes, two of which are designed to measure dielectric properties while the last probe is designed to measure physical properties such as thickness. The probes can be moved in five axes, allowing for fine pitch probing and fast measurement sampling. The logic inputs, as well as a digital voltage regulator and analog voltage regulator, provide flexibility and excellent linearity across a wide voltage range. P-12 XL prober also includes an advanced tool for fast and accurate thickness mapping and dielectric analysis. This mapping tool uses an advanced imaging algorithm that can quickly and accurately detect even the slightest variations in the layer thickness. In addition to this, the unique optical sensor unit allows for highly precise corrections in the variations in the layer thickness. The tool also includes a powerful automatic controller for process automation and optimization. TEL / TOKYO ELECTRON P 12 XL prober is a very powerful machine designed for wafer probing applications that require a high degree of accuracy and repeatability. With reliable performance and convenient tool set, this prober is well suited for use in IC Research, Production, and R&D testing. This tool offers excellent control and flexibility, and can help reduce testing time and cost.
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