Used TEL / TOKYO ELECTRON P-12XL #9142396 for sale

TEL / TOKYO ELECTRON P-12XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9142396
Wafer Size: 12"
Vintage: 2002
Automatic wafer prober, 12" Top plate docking as drawing Right open foup loader 12” Gold chuck unit Interface: GPIB / RS232 200VAC, 50/60Hz, Single phase Auto PAD alignment unit Software version: R14 Series WAPP SACC VIP3A CPU 2002 vintage.
TEL / TOKYO ELECTRON P-12XL Prober is an automated, high-performance prober equipment designed for high-volume semiconductor device testing. It is equipped with an ultra-precise automatic alignment stage, which offers greater precision and stability than manual probers. The system also features a built-in overhead loader, enabling high-speed sample transfer and precise automated alignments. With its fully automated operation, TEL P12XL Prober reduces labor costs and improves the accuracy of measurements. TOKYO ELECTRON P 12 XL Prober has a fully automated unit architecture, which utilizes a high-speed robot for precise automated alignment and sample transfer. It is equipped with a precision X-Y stage for high-precision motion control, as well as a high-resolution optical microscope for visual inspection. The machine also has a built-in overhead loader, which is used to quickly transfer samples from one location to another. P12XL Prober is well-suited for high-volume semiconductor device testing. It enables extremely precise automated alignment of samples, enabling precise results for a variety of semiconductor device measurements. The tool also offers high-speed sample transfer, which greatly reduces the time needed for device testing. Additionally, the built-in microscope ensures that the measured parameters are accurate. This asset features a sophisticated analysis module, allowing users to thoroughly analyze their results. For reliable performance and precise test results, P-12 XL Prober utilizes a range of advanced technologies. It is equipped with a combination of advanced laser interferometry, magnetometer, accelerometer, and camera technology for extremely precise measurement. It also uses a combination of vacuum chuck and linear drives for smooth and accurate motion control. The model is also equipped with specialized software to automate the device analyzing process, making it easier to quickly interpret the test results. The combination of advanced technologies and sophisticated features makes P 12 XL Prober an excellent choice for high-volume semiconductor device testing. Its high-precision alignment capabilities, along with its easy-to-use software and analysis module, make it a reliable and effective solution for device testing applications.
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