Used TEL / TOKYO ELECTRON P-12XL #9151435 for sale

TEL / TOKYO ELECTRON P-12XL is a prober designed for high performance semiconductor and opto-electronic device testing. It is equipped with an advanced probe station that features a programmable X-Y-Θ table capable of fine probing of multiple contacts on a device under test (DUT). This equipment also features an integrated mechanical and electrical characterization station that provides precise electrical measurements with specialized high accuracy impedance measurement, high speed logic level timing analysis as well as high resolution gate pulse measurements. Additionally, TEL P12XL is equipped with advanced imaging capabilities that allow for hardware imaging of the physical surface of the device under test. TOKYO ELECTRON P 12 XL prober is designed to provide reliable probing of high speed digital and analog devices. The system features wear repairable interconnects that allow for repeatable probe connections with minimal wear and tear. In addition, TEL / TOKYO ELECTRON P 12 XL is equipped with advanced signal integrity and power integrity design features that allow for optimal signal propagation across DUT connections. High speed logic level testing capabilities are provided by its integrated PIC logic measurement unit with specialized high speed logic level analyzer. This machine is also equipped with multi-channel analyzers and a sigma Delta modulation control tool that can provide precise power management measurements and power analysis. The integrated opto-electronic test station is designed to support measurements of optical waveguides and other opto-electronic devices. In addition to its advanced technology, TEL P-12 XL prober also offers an ergonomic design with a built-in mechanical XYZ table capable of fine probing of both single-channel and small device test sites. Overall, TOKYO ELECTRON P12XL prober offers an ideal testing solution for high performance, high reliability semiconductor and opto-electronic devices. With its advanced measurement and imaging capabilities, as well as its integrated power/logic signals management asset and wear repairable interconnects, this model provides a reliable solution for testing a wide range of devices. Its ergonomic design and easy to use features make it an ideal prober for semiconductor and opto-electronic device testing applications.