Used TEL / TOKYO ELECTRON P-12XL #9151448 for sale

TEL / TOKYO ELECTRON P-12XL is a versatile die prober designed for the measurement of integrated circuits (ICs). It is a single wafer prober that is capable of probing anywhere from one to 3500 separate ICs at a time. With its high-speed probing capabilities of up to 56.2 MHz and a wide range of probes and tips, TEL P12XL provides a cost-effective solution to IC testing needs. TOKYO ELECTRON P 12 XL is equipped with an advanced CCD image alignment system that allows it to speed up wafer alignment time. This enables the prober to quickly and accurately line up wafers for nearly contamination-free probing. The prober also features an Auto Probe Gear Change system for optimized probe contact and a semi-automatic, repeatable first-200µm pre-alignment feature to ensure repeatable probing accuracy. The prober's stage has a dedicated anti-vibration design to reduce sample vibration and improve probing accuracy. Additionally, TEL / TOKYO ELECTRON P 12 XL boasts a 15-μm XY in-plane resolution with an XYZ accuracy of +/0.1 μm, enabling precise positioning during devices testing. Furthermore, TEL P-12XL can be easily programmed with its intuitive software that provides a graphical user interface and supports a variety of high-level programming languages. The prober also has a built-in data logger that records all parameters and probe cycles, enabling the analysis of probing results over time. P 12 XL supports various tip sizes that make it ideal for finite measurements of sites located on chips that have wafer-level pitch down to 5μm or less. TOKYO ELECTRON P12XL is a reliable and accurate die prober that is an excellent choice for IC testing needs. It offers high-speed probing, advanced alignment systems, and intuitive programming tools. The prober is also ideal for finite measurements and features built-in data logging that can help with the analysis of probe results. P-12XL is a cost-effective solution that can help make wafer-level testing faster and easier.