Used TEL / TOKYO ELECTRON P-12XL #9151472 for sale

TEL / TOKYO ELECTRON P-12XL is a prober designed specifically for the semiconductor industry. It is a dedicated prober capable of inspecting and testing a wide variety of semiconductor devices at the wafer and die level. TEL P12XL provides single-die and multi-die testing operations and can test a wide range of device topologies, such as wafer bumps, QFP, BGA, flip-chip, and super flip-chip. TOKYO ELECTRON P 12 XL features a 5-axis gantry for the high accuracy prober movement and an integrated camera for alignment and verification. The prober uses a combination of a high-precision, servo-controlled linear actuator and a high-load-capacity, dual-axis table to provide an accurate and repeatable probe tracing. P-12XL is designed for high throughput and accuracy with a powerful wafer-to-wafer measurement and analysis equipment. It also features a large-area laser stylus for easy alignment and setup as well as die-level analysis, including high-precision parametric data measurement. The prober is equipped with an auto-teaching system, which allows for the automatic detection of all probe cards and test configurations. The prober's software offers an integrated, user-friendly interface for controlling prober operations, setting-up measurements and automated routines, viewing unit inputs and outputs, and core analysis capabilities. In addition, the software also provides users with a full array of diagnostic functions to help in troubleshooting, analyzing test machine performance, and programming automated test sequences. TEL P 12 XL's dual stage design consists of a transport stage and an active stage. The transport stage minimizes mechanical movement, positioning the wafer from one area to another without the need for physical contact. The active stage, on the other hand, offers stage motion to the point of contact, with a small footprint for large-scale testing applications and a low-noise operation for noise-sensitive designs. Overall, TEL P-12 XL is a highly advanced, highly efficient prober designed specifically for challenging, high-precision semiconductor testing applications. Utilizing an efficient transport tool, combined with an excellent automated control asset, P12XL prober provides users with the ultimate solution for their semiconductor testing needs.