Used TEL / TOKYO ELECTRON P-12XL #9161951 for sale

TEL / TOKYO ELECTRON P-12XL Prober is a fully automated prober for advanced semiconductor metrology testing. It is designed for production testing of next-generation wafers and can handle wafers from small to large sizes up to 12 inches in diameter. It is equipped with five interferometers that perform wafer shape measurements with exceptional accuracy, repeatability and reliability. The prober can measure a variety of parameters including die sizes, surface topography, surface flatness, and surface reflectivity - without ever having to perform manual adjustments. This allows for faster and more accurate measurements, allowing for more efficient production. The Prober has an onboard diagnostics equipment that ensures system accuracy with well-defined procedures that are constantly checked and maintained. The Prober is also equipped with a high-speed robotic sorting unit that quickly sorts wafers and other materials into different groupings. This helps reduce downtime by eliminating the need to manually sort the materials. The Prober also has an integrated ESD protection unit that helps protect and extend the life of the machine, while at the same time providing a high level of safety for users. The Prober's integrated tooling process controller and software offers unprecedented accuracy in controlling and measuring thermal processing, wafer probing and die site measurement and analysis. The tooling process controller helps reduce set up time and eliminates the need for complex and costly calibration processes. The Prober's extensive peripherals and options provide enhanced versatility for semiconductor metrology testing. These include a versatile robotic Wafer Handler, an embossing tool for marking on the wafers, a Laser Marker for marking sites onto the wafer and much more. The Prober has been manufactured to the highest quality standards and is fully compliant with SEMI, ISO and JEDEC specifications. Its modular design and accessories allow custom testing solutions to be created to meet the exact needs of the customers. With its flexible design, it can accommodate various wafer, test and design processes with ease. Its high accuracy and reliable performance make it an invaluable tool in the semiconductor metrology testing market.