Used TEL / TOKYO ELECTRON P-12XL #9161955 for sale
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ID: 9161955
Vintage: 2002
Prober
Loader type: Left
Type (Hot / Cold): Hot
VIP: No
147CON: Yes (No HDD)
MR-MC01: Yes
316: Yes
PST-OPT: Yes
PST-STD: Yes
SIO: Yes
GPIB: Yes
FDD: Yes (Damaged)
Signal tower: Yes
Monitor: Yes
Display driver: Yes
Stage X motor: Yes
Driver: Yes
Stage Y motor: Yes
Driver: Yes
Stage Z motor: Yes
Stage theta motor: Yes
Chuck top: Yes
PT Sensor: Yes
Chuck vacuum solenoid : Yes
Sensor: Yes
Chuck camera: Yes
Bridge camera: Yes
Polish pad: No
Head plate inter-lock sensor: Yes
Shutter: Yes
Indexer Z axis motor: Yes
Indexer Z-axis belt: Yes
Cassette unit: Yes
Sub-Chuck top: Yes
Motor: Yes
Up / Down cylinder: Yes
Solenoid: Yes
Pincette (Upper): Yes
Motor: Yes
Driver: Yes
Pincette (Lower): Yes
Motor: Yes
Driver: Yes
Loader vaccum solenoid: Yes
Sensor: Yes
Wafer sensor: Yes
OCR Unit: No
SACC Unit: Yes
Control board: Yes
Cover inter-lock sensor: Yes
Shutter: Yes
Probe-card interface: Yes
Sensor: Yes
Manual switch: Yes
Hot chuck controller: Yes
Manipulator: No
Main power supply: Yes
Main air / Vacuum fitting: Yes
Main regulator unit: Yes
2002 vintage.
TEL / TOKYO ELECTRON P-12XL is a four-axis, multi-purpose prober from TEL family of probing systems. The prober is designed for wafer probing and test solutions applications, such as those found in the semiconductor manufacturing, MEMS and photonics industries. TEL P12XL implements a variety of motion controls, with an advanced tip-tilt motion control feature that allows the head to move along the X,Y, and Z-axis integrally to enable high throughput and fast general probing. The four-axis motion control also allows for quick data acquisition and analysis due to the simultaneous motion of the head and motion control axis. The probing head of TOKYO ELECTRON P 12 XL, utilizes a 200-mm long range motorized Z-axis approach to reduce over-travel time, allowing for faster probing to be completed with lower mechanical stress on the probing head. P 12 XL is also equipped with a unique auto-stubby wiring equipment that eliminates the need for manual wire stubbing, and it also ensures that connection lengths are optimized for highest electrical performance. TOKYO ELECTRON P-12XL is also incorporated with a highly accurate and precise multi-grid stationary alignment system, which is capable of aligning chips on different parts of wafer such as logic and analog circuit sections, memory sections and logic/analog bundle sections. The alignment unit is capable of achieving a high accuracy of 0.1um with both alignment and area mark detection. TEL P 12 XL also features a graphic user interface that can be controlled and programmed via TOKYO ELECTRON-LNX Ver2.2 and above, with advanced tools to configure settings, view and load and execute probe recipes. This helps to facilitate the setting and operation of P12XL. Additionally, TEL / TOKYO ELECTRON vector scan technology is incorporated in TEL / TOKYO ELECTRON P-12 XL which allows for efficient and fast probing for various products. TEL P-12 XL is a versatile and powerful prober aimed at semiconductor manufacturing and other industrial test solutions. The integrated multi-grid stationary alignment machine, 200-mm long range motorized Z-axis approach, vector scan technology, auto-stubby wiring tool, and four-axis motion control combine to provide high throughput, accuracy, and precision for a wide range of industrial uses.
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