Used TEL / TOKYO ELECTRON P-12XL #9161955 for sale

TEL / TOKYO ELECTRON P-12XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9161955
Vintage: 2002
Prober Loader type: Left Type (Hot / Cold): Hot VIP: No 147CON: Yes (No HDD) MR-MC01: Yes 316: Yes PST-OPT: Yes PST-STD: Yes SIO: Yes GPIB: Yes FDD: Yes (Damaged) Signal tower: Yes Monitor: Yes Display driver: Yes Stage X motor: Yes Driver: Yes Stage Y motor: Yes Driver: Yes Stage Z motor: Yes Stage theta motor: Yes Chuck top: Yes PT Sensor: Yes Chuck vacuum solenoid : Yes Sensor: Yes Chuck camera: Yes Bridge camera: Yes Polish pad: No Head plate inter-lock sensor: Yes Shutter: Yes Indexer Z axis motor: Yes Indexer Z-axis belt: Yes Cassette unit: Yes Sub-Chuck top: Yes Motor: Yes Up / Down cylinder: Yes Solenoid: Yes Pincette (Upper): Yes Motor: Yes Driver: Yes Pincette (Lower): Yes Motor: Yes Driver: Yes Loader vaccum solenoid: Yes Sensor: Yes Wafer sensor: Yes OCR Unit: No SACC Unit: Yes Control board: Yes Cover inter-lock sensor: Yes Shutter: Yes Probe-card interface: Yes Sensor: Yes Manual switch: Yes Hot chuck controller: Yes Manipulator: No Main power supply: Yes Main air / Vacuum fitting: Yes Main regulator unit: Yes 2002 vintage.
TEL / TOKYO ELECTRON P-12XL is a four-axis, multi-purpose prober from TEL family of probing systems. The prober is designed for wafer probing and test solutions applications, such as those found in the semiconductor manufacturing, MEMS and photonics industries. TEL P12XL implements a variety of motion controls, with an advanced tip-tilt motion control feature that allows the head to move along the X,Y, and Z-axis integrally to enable high throughput and fast general probing. The four-axis motion control also allows for quick data acquisition and analysis due to the simultaneous motion of the head and motion control axis. The probing head of TOKYO ELECTRON P 12 XL, utilizes a 200-mm long range motorized Z-axis approach to reduce over-travel time, allowing for faster probing to be completed with lower mechanical stress on the probing head. P 12 XL is also equipped with a unique auto-stubby wiring equipment that eliminates the need for manual wire stubbing, and it also ensures that connection lengths are optimized for highest electrical performance. TOKYO ELECTRON P-12XL is also incorporated with a highly accurate and precise multi-grid stationary alignment system, which is capable of aligning chips on different parts of wafer such as logic and analog circuit sections, memory sections and logic/analog bundle sections. The alignment unit is capable of achieving a high accuracy of 0.1um with both alignment and area mark detection. TEL P 12 XL also features a graphic user interface that can be controlled and programmed via TOKYO ELECTRON-LNX Ver2.2 and above, with advanced tools to configure settings, view and load and execute probe recipes. This helps to facilitate the setting and operation of P12XL. Additionally, TEL / TOKYO ELECTRON vector scan technology is incorporated in TEL / TOKYO ELECTRON P-12 XL which allows for efficient and fast probing for various products. TEL P-12 XL is a versatile and powerful prober aimed at semiconductor manufacturing and other industrial test solutions. The integrated multi-grid stationary alignment machine, 200-mm long range motorized Z-axis approach, vector scan technology, auto-stubby wiring tool, and four-axis motion control combine to provide high throughput, accuracy, and precision for a wide range of industrial uses.
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