Used TEL / TOKYO ELECTRON P-12XL #9161960 for sale

TEL / TOKYO ELECTRON P-12XL is a high-performance prober designed to maximize the precision and accuracy of device test. It is designed for use in both semiconductor wafer testing and advanced applications such as wafer level burn-in, RF measurements, vibration testing, power device testing, MEMS testing and more. With a large range of reliable and proven components, TEL P12XL achieves precision even at the highest speeds, making it well-suited for high-volume tasks. The prober also offers a range of quick-change and user-definable options, such as sample movements, scan patterns, calibrations, data handling and more. TOKYO ELECTRON P 12 XL features advanced technology including a height sensor to minimize wafer tilt, an independent lift equipment, and a zero-wear contact system that helps to minimize contact force. The prober also has a bead loading Arm, slit chuck mechanical unit, and precision alignment technologies to ensure stable contact over long sampling periods. Additionally, TEL P 12 XL can be outfitted with a wide range of automated features, such as a purge chamber, auto start and auto calibration capabilities. TEL / TOKYO ELECTRON P 12 XL is designed with a top-loading configuration, with a maximum wafer size of up to 8 inches. The wafers can be loaded using a dedicated handler, or manually. Wafers can be loaded and unloaded with ease, and P-12XL can accommodate up to 8 wafers per load, increasing test throughput and speed. The prober also has an advanced stage, which utilizes an integrated 6-axis motion controller to ensure exact sample placement and control. TEL P-12 XL also features an integrated toolkit for further customization and automation. This includes a range of probes and configurations, including contact and non-contact test probes, active and passive probes, and reference probes. Users can also create customized scripts and programs to automate certain tests, as well as share data and store probe configurations, helping to optimize their testing setup and reduce setup time. P 12 XL also has an advanced control machine, which is designed to be highly intuitive and user-friendly. The GUI interface offers simple, streamlined controls and functions, allowing users to quickly access the command panel and control settings. Additionally, the tool can be integrated into any machine's existing asset, allowing control and sharing of data without the need for external hardware. Overall, P12XL prober offers a range of advanced technologies and features for increased precision and accuracy in both semiconductor wafer and advanced applications. With a user-friendly interface and automated features, the prober is designed to help streamline testing and reduce setup time.