Used TEL / TOKYO ELECTRON P-12XL #9179071 for sale
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ID: 9179071
Vintage: 2001
Automatic probers
Gold hot chuck top, 12"
Temperature controller
Right loader: Open casette type
Top plate assembly
WAPP: 142 x 155 mm
SACC
CPU: VIP3A / VIP3
D301 Hinge manipulator
Input: AC 200 V
GPIB Interface
Automatic PAD Alignment unit
2001 vintage.
TEL / TOKYO ELECTRON P-12XL is a prober with an overall length, width and height of 608 x960 x 800 mm, respectively and a gross weight of approximately 50kg. It is a low-stiction prober with a small-stiction, low-force Z-stage. TEL P12XL prober provides excellent measurement and probing accuracy and the ability to handle the extreme environmental conditions common in semiconductor device testing. Its top-of-the-range thermal compensation equipment maintains accuracy when measuring at temperatures up to 200°C and higher. The advanced motion control system of TOKYO ELECTRON P 12 XL prober features a linear voice coil/piezo element structure for fast, precise accuracy and reliability. Its high-speed Z-axis with a sampling rate of 1mm x 0.2μm and a max speed of 4mm/s is ideal for scanning applications and device testing of small and large devices. P 12 XL prober offers various modular wafer handling options including manual and mechanical wafer transfer, wafer guide, wafer sorting and wafer cleaning. It is designed with a universal chuck that can manage a wide range of substrates, including glass, plastic, quartz and other materials. TOKYO ELECTRON P-12 XL prober customizes probe cards and changers and is equipped with an intuitive touch screen display to support flexible unit configurations. It also offers versatile scalability with multiple positions and optical characterization ports. Furthermore, a modular tool adapter set and motorized Z-stage coupled with an optional laser alignment machine allows TEL P-12XL to perform device testing with extremely high accuracy. The prober also features a built-in heater with a flexible control range up to 200°C. Overall, P-12XL prober is an ideal choice for semiconductor device testing and other probing applications. It offers excellent accuracy and reliability, perfect for those needing a fast and accurate prober with a high degree of flexibility.
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