Used TEL / TOKYO ELECTRON P-12XL #9183645 for sale

TEL / TOKYO ELECTRON P-12XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9183645
Wafer Size: 12"
Vintage: 2003
Wafer probers, 12" 2003 vintage.
TEL / TOKYO ELECTRON P-12XL Prober is a powerful wafer prober used in the testing and inspection of semiconductor wafer samples. It was initially released in Japan in the late 1990s, and has since become a widely trusted prober for wafer testing. It utilizes a programmable, computer-controlled wafer stage and a low-vibration environment to thoroughly examine the surface of a wafer sample. TEL P12XL Prober is equipped with a 3-axis linear motion stage, which allows the prober to scan an entire wafer sample up to 200-300mm and detect any defects on its surface. TOKYO ELECTRON P 12 XL Prober is capable of managing and controlling both wafer and die size, enabling it to scan a large number of wafers with uniform stage motions and travel speeds. Additionally, the prober is equipped with a highly functional software platform, which allows it to be used with a wide range of applications. TEL / TOKYO ELECTRON P12XL Prober is unique in that it can detect even the smallest sized particles and defects present on a sample. Because of its high levels of precision and accuracy, it is widely used across various semiconductor industries. It has advanced digital reading capabilities, which allow technicians to measure the parameters of each particle detected, enabling them to precisely diagnose faults in the wafer samples. TEL P-12XL Prober also offers a range of options for its users. It is equipped with an advanced mechanism for controlling the direction and speeds of the stage, meaning technicians can control the sensitivity, timing and accuracy of their probing. It also has an integrated image-storing system, allowing technicians to record their probing results directly onto the wafer for easy reference later. Overall, TOKYO ELECTRON P12XL Prober is a powerful and precise prober used in the semiconductor industry. Its accurate probing capabilities, precise motion controls and versatile applications make it an ideal choice for examining wafer samples. It is also highly reliable and easy to maintain, further adding to its appeal.
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