Used TEL / TOKYO ELECTRON P-12XL #9209460 for sale

TEL / TOKYO ELECTRON P-12XL prober is a high-precision, automated probe positioning equipment that is used in semiconductor fabrication to measure electrical properties. This prober system uses a three-dimensional, redundant linear drive gesture control unit that is designed to enable highly-accurate and repeatable position movements. This prober machine is a cost-effective, reliable, and advanced solution that is widely used in a variety of industrial application areas. TEL P12XL prober comes with a smartly-designed and rigidly-structure X-Y stage, as well as an encoders-equipped Z-axis. It also has a Z-alignment tool, which provides very accurate and repeatable positioning along the X, Y, and Z axes to ensure excellent measurement accuracy. It is designed to have a range of up to 30mm. The machine is intuitively operated with a Human Machine Interface (HMI) that provides a range of settings for users. It offers users flexibility in terms of customization and maintenance of the working environment, ensuring users have the best experience possible with the prober. It is designed to be able to precisely move a probe head in the XYZ axes with excellent pitch and yaw motions, so that the operator can position a probe accurately. TOKYO ELECTRON P 12 XL prober is equipped with a shielded chuck, which increases the distance between the prober and the sample to avoid stray signals and unwanted noise. It is also designed to reach speeds of up to 2000 Hz/s. It is able to be programmed to accurately handle a range of sizes and shapes, allowing high efficiency to be achieved. The prober is constructed with advanced heat dissipation capabilities that avoid heating issues, while the asset is also vibration-resistant, assuring reliable working performance. A user-friendly graphic interface is designed to offer quick and easy access to a range of functions, making it easier for the operator to control and manage the machine. Overall, TEL P 12 XL prober is an excellent solution for probing semiconductor devices for high accuracy and repeatability. It offers users an efficient, highly precise, and reliable production environment.