Used TEL / TOKYO ELECTRON P-12XL #9220058 for sale

TEL / TOKYO ELECTRON P-12XL is an advanced prober designed for semiconductor device testing. It combines a high-resolution, high-speed laser scatterometer with a stable and highly adjustable probe card. This combination allows users to quickly and accurately measure the electrical characteristics of semiconductor devices, such as contact resistance and thermal performance. TEL P12XL's laser scatterometer uses a combination of laser light and a high-magnification optics to accurately measure a device's surface properties. The laser scatterometer is capable of measuring melting point and contact angle, as well as refractive index and surface roughness. The optical equipment also enables TOKYO ELECTRON P 12 XL to measure extremely small features on the surface of a device, such as fine circuit traces and solder bumps. P12XL's integrated probe card is designed for maximum stability and accuracy. The card offers a wide range of adjustable probe heights and contact forces, allowing for precise and repeatable measurements. The card also has an anti-slip system, which helps eliminate inaccuracies caused by thermal or mechanical shock. It includes both vertical and horizontal force sensors, as well as a built-in temperature monitor, which ensures that device testing conditions remain constant. P 12 XL utilizes a sophisticated software interface to quickly and accurately measure device performance. This software allows users to quickly configure device testing parameters, such as contact force, temperature, and optical magnification. The software also provides accurate feedback on device measurements, including absolute contact resistance and deviation from expected values. In addition, TOKYO ELECTRON P-12 XL is equipped with a powerful unit monitor and management unit. The unit provides real-time information on the condition of the prober and connected device, as well as enables users to manage tests and store results. This ensures that results are accurate and reproducible. TEL P-12XL is an advanced and reliable prober designed for accurate and repeatable semiconductor device testing. It combines a high-resolution laser scatterometer with a stable and highly adjustable probe card, allowing users to quickly and accurately measure the electrical characteristics of semiconductor devices. TOKYO ELECTRON P-12XL's sophisticated software interface enables users to quickly and easily configure device tests, measure results, and store data for reproducible results. The unit is also equipped with an advanced machine monitor and management unit, ensuring that results remain accurate and consistent.