Used TEL / TOKYO ELECTRON P-12XL #9254690 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9254690
Vintage: 2005
Wafer prober XY Probing accuracy: ± 4.0 μm Z Probing accuracy: ± 5.0 μm Optical system: ASU/BCU-I Probing force: 100 kg 2005 vintage.
TEL / TOKYO ELECTRON P-12XL is a prober used in semiconductor wafer probing applications. It is a large, multi-functional prober that is capable of providing detailed and accurate SEM analysis. It is designed with precision instrumentation to provide a high level of accuracy and reliable operation. TEL P12XL consists of a high-resolution, 7-axis robotic manipulator arm, a 6-axis, double-sided, automated prober equipment, and a fully automated configurable secure test environment. Its powerful analytical capabilities enable automated wafer probing for multiple wafers at once in both 2D and 3D formats, with very high accuracy. The prober has a sample-holding capacity of up to 12 samples, providing a relatively large sample size for probing applications. The 6-axis manipulator arm is designed to move samples within the testing area, carefully placing them under the automated prober to be tested. In addition, a variety of sample holder and prober heads are available to accommodate a wide range of sample sizes and materials. Furthermore, it has an integrated vision and data capture system that enables unit operation to be monitored and troubleshot remotely. The integrated software suite provides a wide range of analysis tools including wafer zoning, block analysis, circuit analysis, and statistical process control. All data is monitored and stored in a secure database. TOKYO ELECTRON P 12 XL also has advanced automation capabilities, allowing it to be configured for customized applications. The sample management machine allows multiple tasks to be setup and managed automatically, and an intuitive user interface facilitates the setup and control of multiple test sequences and user profiles. Configuration files for each task can be quickly and easily updated, uploaded, and stored for later use, enabling quick and efficient operation. This prober is ideal for use in semiconductor processing and research, providing accurate and reliable data processing, analysis, and monitoring capabilities. It provides a flexible, reliable, and cost-effective tool for wafer probing and testing applications.
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