Used TEL / TOKYO ELECTRON P-12XL #9254709 for sale

TEL / TOKYO ELECTRON P-12XL is a prober, which is an automatic testing equipment used to test the electrical and mechanical characteristics of integrated circuits. The prober is an all-in-one device that is used to probe and test ICs, enabling the operator to quickly and efficiently take measurements of the ICs while minimizing potential sources of errors. TEL P12XL is a highly accurate prober that is typically used in research and development (R&D) labs and semiconductor device production/testing facilities. TOKYO ELECTRON P 12 XL features a computer-controlled three-axis positioning system that is capable of moving to exact positions with minimal errors. It is designed for manual or automation testing in both standalone and networked environments. TOKYO ELECTRON P12XL prober has an advanced positioning unit that enables linear and rotational motion for probing and testing ICs. The machine also comes with an automatic chuck positioning feature to ensure very high positional accuracy and repeatability of the chuck position for probing. The prober is equipped with a range of probes, such as test probes, probeware and custom-made probes, as well as advanced accessories to allow for a wide range of advanced testing and probing applications. P12XL prober has a wide range of features such as multiple wafer handling options, built-in R&R features, single or dual port test heads, multiple frequency sources, advanced adjustment option of its sliding arm (for close proximity testing) and other advanced features. In addition, TEL P-12 XL is designed for maximum throughput and productivity. It has a highly accurate automated loading/unloading tool to efficiently handle multiple wafers with minimal down time. Also, its capabilities to automatically recognize different types of IC packages and access different test setups greatly increases testing accuracy and speed. Overall, TEL / TOKYO ELECTRON P 12 XL prober is an advanced IC testing asset. It features high accuracy, speed and precision, as well as advanced features that allow it to cover a wide range of applications. Its automated operation, multiple wafer handling capability, wide range of probes and accessories, and advanced features make it a highly reliable and robust prober for IC testing.