Used TEL / TOKYO ELECTRON P-12XL #9258229 for sale

TEL / TOKYO ELECTRON P-12XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9258229
Wafer prober XY Probing accuracy: ±4.0 μm Z Probing accuracy: ±5.0 μm Probing force: 100 kg Optical system: ASU/BCU-I.
TEL / TOKYO ELECTRON P-12XL is a prober specifically designed to meet the demanding requirements of the semiconductor and related industries. TEL P12XL was developed to provide precision and stability in surface probing and test processes. It offers a high degree of motion control and accuracy to effectively evaluate wafers and other small surface areas. TOKYO ELECTRON P 12 XL Prober is capable of a high level of performance with minimal operator effort. It utilizes a conductive measurement method for electrical and physical parameters. This method provides excellent repeatability of measured values and allows for maximum precision and flexibility. TOKYO ELECTRON P-12 XL uses an advanced servomotor-driven stage design to enable high-precision scanning. The integrated computerized control system ensures accurate scan patterns and data capture. TEL P-12XL is designed for high flexibility and modularity, allowing for the addition and integration of various modules, including optical, thermal, and acoustic ones. This enables the machine to cover a variety of different application fields. The control system is easy to use and can be customized according to user requirements, offering multiple operating modes. P12XL also features advanced safety features to protect against potential overtesting or overtaking issues. TOKYO ELECTRON P12XL features high-tech, efficient components and superior engineering, offering optimal performance and reliability in harsh production environments. It is durable and highly reliable and features a mission indicator unit to detect probe tip contact and recognizing foreign object debris. P-12XL offers a variety of sophisticated features and benefits, making it a highly cost-effective solution for a variety of applications. It provides a reliable, repeatable, and accurate means for testing and evaluation of wafers and other small surfaces. TEL P 12 XL is perfect for high-precision scanning, surface profiling and test processes, and is highly recommended for semiconductor and related industries that require precision performance.
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