Used TEL / TOKYO ELECTRON P-12XL #9267381 for sale

TEL / TOKYO ELECTRON P-12XL is a prober manufactured by TEL Ltd., a leading semiconductor company. TEL P12XL is an advanced probe card designed to provide superior performance in electrical testing of a wide variety of semiconductor devices. It features a large number of probe tips and a wide variety of options for electrical signaling, making it suitable for a range of applications. TOKYO ELECTRON P 12 XL is a high-precision tool that offers excellent accuracy and repeatability during the probing process. It is equipped with 12 simultaneous moveable probe tips, allowing users to scan a variety of patterns on a device under test with great speed and efficiency. The probe card utilizes a sophisticated algorithm-driven software package to measure electrical parameters during the probing operations. The software automatically modifies the operating parameters to meet the user's requirements and optimize performance. TEL P 12 XL also features a variety of other features. It is designed to support a wide range of wafer substrates, including Si, Ge and SiGe. The prober can also accommodate a variety of chip sizes, ranging from 0.25mm to 8mm. It offers connectivity via a USB 2.0 port, enabling users to view, store and share data. The prober also features built-in diagnostic tools, enabling users to rapidly identify issues and respond to them quickly. TOKYO ELECTRON P-12 XL is also customizable, allowing users to adjust the operating parameters of the device, including the power and timing signals. In addition, the prober is equipped with a number of safety features, including built-in fault protection, automatic device protection and an inner conductor control mechanism. Finally, TEL P-12XL is also capable of controlling multiple devices at once, allowing users to rapidly scan large numbers of objects quickly and efficiently. Overall, P12XL is an innovative and reliable prober, offering superior performance and a wealth of options for users looking for a versatile and powerful tool for testing semiconductor devices.