Used TEL / TOKYO ELECTRON P-12XL #9269295 for sale

TEL / TOKYO ELECTRON P-12XL Prober is a complete wafer prober equipment designed for industrial applications. It is suitable for a variety of applications including dicing, probing and packaging of semiconductor devices. TEL P12XL Prober is designed to measure and record various electrical parameters while providing accurate alignment of the test electrodes. The system has a 6-inch wafer capability and a wafer size of up to 200 mm. TOKYO ELECTRON P 12 XL Prober is equipped with a two-axis automation unit which enables it to move wafers in both X and Y directions. The X-axis movement is achieved by a precision rack and pinion drive and the Y-axis by an advanced servo motor machine. It provides an accurate, reliable and fast alignment of the probing needles to the contact pads. TEL / TOKYO ELECTRON P 12 XL Prober has a C-shape design with a capability to support up to six test needles. The tool is driven by a dedicated PC interface, equipped with an advanced optical display and alarm asset. TEL / TOKYO ELECTRON P12XL Prober is equipped with a number of features for precision testing and inspection. The model is provided with an eddy current equipment which enables high precision measurements accurately with the help of a high-resolution color LCD display. TEL P-12 XL Prober also features a high-speed scanning system for making quick measurements. Furthermore, the unit includes an EPROM machine for providing a data storage platform and a Centaur E-series flash tool for verification of data. P-12 XL Prober is compliant to ISO 9001 and ISO 14001 standards as well as IEC 1117 regulations ensuring quality, reliability and accuracy in measurements. The asset is designed to comply with static and temperature requirements as specified by various test standards. Furthermore, the model is provided with a dedicated rack and a user-friendly software suite for monitoring, controlling and analyzing test results. P-12XL Prober is a state-of-the-art equipment designed to provide a complete wafer prober solution for industrial testing and inspection applications. It features an advanced automation system for wafer positioning, a high-precision scanning unit for fast measurements and an EPROM machine for providing a data storage platform. Furthermore, the tool is compliant to various industry standards and offers a user-friendly interface for better control and monitoring of test results.