Used TEL / TOKYO ELECTRON P-12XL #9279691 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9279691
Probers Tri-temperature Hot / Cold chuck temp: (30°C to 150°C) Gold (WAT Chuck) Hard Disk Driver (HDD) Floppy Disk Driver (FDD) OCR: INSIGHT 1700 Single cassette Fail mark inspection Auto needle alignment Auto needle height GB-IP Ethernet WAPP Air type Operating system: Rzz00-R015.01-T Configuration disk CPU Board: VIP3 Power supply: 200 V, AC No chiller No APC No SACC No motor No air No cart 2008-2009 vintage.
TEL / TOKYO ELECTRON P-12XL is a high-precision prober designed specifically for failure analysis of semiconductor devices. It features an advanced automated measurement platform, enabling precise and rapid testing of semiconductor wafers. TEL P12XL prober boasts a range of features and capabilities, including a high-speed breakthrough indexing system and dedicated touch-sense and tip-sense test probes for precise determination of device failure locations. TOKYO ELECTRON P 12 XL also has a high-resolution digital imaging system for capturing die images with extreme accuracy, providing detailed visibility into semiconductor defects. Additionally, its Force Balance/Vacuum Grip System minimizes contamination and ensures controlled device removal from its test board. In addition to its precision probing features, TOKYO ELECTRON P-12XL offers a suite of software tools, such as a wafer pattern file builder and test program editor, allowing engineers to quickly and efficiently set up tests and run tests without extensive programming or data manipulation. TEL / TOKYO ELECTRON P-12 XL also offers numerous fault detection and analysis functions, including simultaneous probing of multiple devices, high-speed fault sensing, and a built-in die characterization tool for improved yield analysis. The prober also supports multiple wafer sizes and types, including ceramic, glass, and quartz substrates. Constructed from corrosion-resistant steel and copper, P-12XL is designed with customer usability in mind, featuring easy-to-operate controls and LED indicators for monitoring accuracy and performance. P-12 XL is designed for use in ultra-precise failure analysis applications at the semiconductor level. It is also capable of testing for reliability and validity, analyzing device integration and signal flow, and testing safety and environmental norms. Ideal for advanced research and development labs, TEL P-12 XL offers exceptional performance, accuracy, and reliability in a user-friendly package.
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