Used TEL / TOKYO ELECTRON P-12XL #9314610 for sale

TEL / TOKYO ELECTRON P-12XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9314610
Wafer Size: 12"
Vintage: 2005
Wafer prober, 12" 2005 vintage.
TEL / TOKYO ELECTRON P-12XL Prober is a highly advanced and accurate device used in the semiconductor industry for electrical probe tests of ICs, LSIs and discrete components. It is designed to ensure reliable, uninterrupted and high-throughput probing for production testing use. The prober is equipped with a 12-site Precision Probe Station which provides automatic, fast, and accurate positioning of the device-under-test (DUT). This allows probing from a single wafer or multiple wafers at once. The station also has an advanced XYZ stage to position the probes with sub-micron accuracy and repeatability. This high-precision positioning, combined with the advanced wafer mapping functionality enables TEL P12XL to accurately probe high-density integrated-circuit devices. TOKYO ELECTRON P 12 XL prober employs a signal sourcing/sensing technology to accurately measure device parameters at each of the 12 sites. This measurement technique produces highly accurate, repeatable and reliable results which allow advanced testing of complex structure. The device also includes a sophisticated real-time system that monitors and controls circuit operation while measuring device parameters. TOKYO ELECTRON P12XL prober also features an embedded wafer loader that makes it ideal for production runs. This wafer loader is designed to automatically transition between wafers in a single operation, drastically reducing the manual processes. Additionally, the prober utilizes a patented version of embedded defectivity detection algorithms which ensure fast and accurate defect location and analysis. P12XL prober offers superior performance for cutting edge IC production testing. It is designed for reliable, repeatable and error-free testing, making it ideal for a range of industries from semiconductors to consumer electronics. The prober is also capable of high-precision placement and measuring, fast measurement cycle time and its high degree of automation allows users to utilize the prober to its fullest potential.
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