Used TEL / TOKYO ELECTRON P-12XL #9350458 for sale

TEL / TOKYO ELECTRON P-12XL Prober is an analytical tool used to analyze electrical properties of semiconductor devices in production testing. It has the capacity to measure and analyze up to 6 devices at a time. The equipment is composed of 5 main components, a probe card, prober head, XYZ table, vision system, and measuring tools. First, the probe card is the center of the prober, allowing the analysis signals to be sent and received from the device under test (DUT). It is composed of a number of probes that require a high level of precision and accuracy for reliable analysis. The prober head is the main part of the unit that controls the motion of the probe card. It is designed to be able to move in the X (longitudinal) and Y (transverse) directions, as well as to adjust the velocity, pressure and force of the probes to provide the appropriate contact between the probe and the DUT. The XYZ table is the motorized platform that moves the devices and provides the necessary precision for accurate analysis. It is powered by servo motors that allow for precise positioning and movement of the DUT. The vision machine is composed of a number of different sensors and optics that provide the necessary feedback for accurate positioning and movement of the DUT. The advanced sensors offer the capability of imaging and analysis of the DUT and the device environment in three dimensions. Finally, the measuring tools are the collection of instruments used to measure the electrical parameters of the DUT. These include voltage and current probes, meter bridges, and network analyzers. TEL P12XL Prober is an advanced tool that offers advanced analytics and accuracy in measuring and analyzing semiconductor devices. Its five components provide reliable and precise analysis of the device and its environment, allowing for accurate results that can be used to improve device operation and performance.