Used TEL / TOKYO ELECTRON P-12XL #9351425 for sale

TEL / TOKYO ELECTRON P-12XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9351425
Wafer Size: 12"
Vintage: 2002
Prober, 12" 2002 vintage.
TEL / TOKYO ELECTRON P-12XL is a multi-functional prober engineered for high accuracy and performance. It is equipped with a new design that includes a prober head, advanced sensors and a stage drive for faster and more precise measurements. The multi-functional prober provides many features that can be effectively used for a variety of applications such as wafer testing, failure analysis, and device development. The prober uses a flexible and dynamic design that makes possible a wide range of operations on substrates from small chip components to large wafers. The prober includes advanced sensors, such as XY and XYZ motion in all axes and linear motor drives, to improve accuracy and measurement speed. The new design also makes it possible to measure substrates with greater accuracy and uniformity over a wide range of materials, including silicon and glass. The prober is designed to provide high sensitivity even when measuring at very high subtile levels. This makes it suitable for measuring devices with very low yields and wafers with small faults. Additionally, the sensor-based feedback system provides easier and stable operation, even when measuring in high-vacuum or inert gas environments. The prober also has a self-diagnostic feature that automatically detects and corrects any faults detected, improving operational reliability. The prober has an integrated computer control system, allowing the user to create complex measurements and analyze results on-site. The user interface has been designed for easier data management and the software is continuously updated to meet the needs of the latest technologies. This prober can also be synchronised with other systems for increased efficiency. Overall, TEL P12XL is an improved multi-functional prober specially designed for detailed analysis of materials from small chip components to large wafers. It provides superior accuracy and stability in tests, as well as an integrated computer control system that allows for better data management, complex measurements, and faster results. The prober is ideal for those who need a reliable and sophisticated prober that can handle a wide range of applications.
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