Used TEL / TOKYO ELECTRON P-12XL #9362193 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XL
ID: 9362193
Vintage: 2002
Prober Chuck type: Hot / Cold, Ni Chuck temperature: Ambient ~ +150°C CPU Board: VIP3A GPIB I/F Board SACC Standard HF: HM30 OCR: IS1700 Bracket WAPP Cleaning unit Rear wafer table Hard Disk Drive (HDD) Floppy Disk Drive (FDD) Operating system: Gzz00-V014 08Rj 2002 vintage.
TEL / TOKYO ELECTRON P-12XL is a prober designed and manufactured by TEL Corporation, a leading producer of semiconductor processing equipment. This multi-functional prober is designed specifically for advanced semiconductor device testing and characterization and is ideal for use during product development, qualification and late-stage yield learning. TEL P12XL is powered by a powerful, high-performance computer which runs a comprehensive suite of TOKYO ELECTRON-developed software. This software enables automated wafer loading, wafer probing, and test data management, making it an ideal tool for fast and efficient semiconductor device testing. The equipment is also equipped with a pin spotter, which automatically aligns laser-based vision on the wafer's contact sites for accurate contact points. The prober offers a range of probing options, from conventional probing to advanced technologies such as scanning electron microscope (SEM)- and atomic force microscopy (AFM)- based probing, which is capable of detecting failures at package level. Furthermore, this highly adaptable prober is capable of handling all types of high-density substrates, including flip chips and ball-grid arrays. With its high-speed data acquisition and analysis capabilities, TOKYO ELECTRON P 12 XL can quickly detect product variation problems and eliminate potential failure modes, while also optimizing performance of process change. In terms of accuracy and sensitivity, TEL / TOKYO ELECTRON P-12 XL is designed to ensure high-precision probing of static and dynamic signals by combining coil & cantilever technologies with compensations on the stage motion direction. Additionally, the system is equipped with an on-wafer calibrator which can be used to fine-tune probe force for improved repeatability and accuracy of testing. To minimize downtime of testing, TEL P-12 XL features a 'Zero Malfunction' automated tool selection and job start-up unit which allows operators to select the optimum tool without fail. Furthermore, this versatile machine is capable of supporting manual or robotic handling, allowing users to quickly switch from manual to robotic based on the device application. Overall, TOKYO ELECTRON P12XL is a highly advanced, yet user-friendly prober designed to meet the demands of advanced semiconductor device testing and characterization. Thanks to its comprehensive suite of software, versatile tool selection, and high-precision probing capability, P 12 XL is an ideal tool for ensuring fast, accurate and reliable testing of semiconductor devices.
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