Used TEL / TOKYO ELECTRON P-12XLm #293592018 for sale

TEL / TOKYO ELECTRON P-12XLm is a prober equipment developed and manufactured by TEL. It is a fully-automated system that provides operations to help characterize and measure semiconductor device wafers. TEL P12XLM prober has a very high repeatability and reliability, meaning that it is capable of providing exactly the same results over multiple probers. The unit's easy-to-program software is user-friendly and provides precise control of prober operations. Not only does TOKYO ELECTRON P 12 XLM provide precise measurements, it also accelerates production testing by providing precise settings and programs that can be used over multiple probers in the same environment. The integrated electromagnetic referencing platform and remote sample loading table associated with TEL / TOKYO ELECTRON P-12 XLM provide great versatility and modularity. In addition, the LED digital microscope enables users to quickly analyze sample images and make precise local measurements on wafers or substrates. Furthermore, the prober comes with its own XYZ Coordinate Presetter which allows for easy setup and precise positioning of the cantilevers and substrates. Also, simultaneous multi-point testing is possible, allowing for quick and efficient testing of multiple devices. Moreover, TOKYO ELECTRON P-12XLm has ultra-low leakage probes that provide superior signal integrity and minimized cross-talk, thereby ensuring accurate testing of specimens. Additionally, the prober includes a temperature controller and a highly-efficient temperature driver, allowing for precise control and accuracy of temperature at all specified points. Moreover, due to the robust design of the machine, it is able to withstand thermal and mechanical shocks, and it is durable enough to withstand long hours of continuous testing. Finally, TOKYO ELECTRON P12XLM is equipped with an array of safety features to ensure safe operation and prevent accidental damage to the tool. Overall, P 12 XLM is an advanced prober asset that provides unbeatable accuracy, repeatability, and speed for efficient wafer probing and testing. Its robust design and array of features make it an ideal choice for any semiconductor testing and measurement environment.